Description General description • Size: 120 x 110 x 35 mm3 • Probcard size: 40 x 76 x 17 mm3 • Material: aluminum C250, FR4; plastics • Probcard type: “OFET”,2 pieces miniature spring contact 6A • Weight: 280g • Connection: BNC panel jack Application For material scientists in the field of organic semiconductors, it is critically important to have standardized device architecture for material analysis. In order to simply and quickly measure OFET components with a given substrate size, pad grid and pad arrangement in large batches, this miniprober was developed. It has two electric connections on the front (source and drain) and one connection on the back (gate) and does not require probe station, samplers or manipulator pins. A reliable interconnection is established on contact pads, which are only 0.5 × 0.5 mm² in size. Customized versions of the miniprober varying the connection arrangement, the position and number of the pads are possible. This makes the miniprober suitable for other applications in addition to OFETs. Signals are transmitted to the measurement instrument by BNC or triax cables. Features and Benefits Advantages of the OFET Miniprober are: • No probing system required • Easy DUT handling • Stable and secure connection Packaging in foamed plastic case, packed with manual Preparation Note Contact check with microscope is recommended. Legal Information Product of Fraunhofer IPMS